Discover the importance of the I-V characteristic curve, a graphical representation of current (I) and power as a function of voltage (V), widely used for characterizing electronic devices.
Join Liz Makley, Keithley Application Engineer, as she demystifies the I-V curve and its significance in understanding device behavior, performance, and reliability. Through real-world test setups, Liz will demonstrate how to generate an I-V curve, exploring its shape, characteristics, and the valuable insights it provides into the electrical properties of devices like semiconductor MOSFETs and diodes. She'll also share some pro tips for I-V characterization.
By attending this session, you will gain a solid foundation in basic characteristics and be equipped to tackle more complex tests in the future.
Register now and get on demand access to past sessions in the Measurement 101 Series.
- Session 1: Measurements 101
- Session 2: Measuring with an Oscilloscope 101
- Session 3: Sensor Measurements 101
- Session 4: RF Measurements 101
