Wednesday, May 13, 2026
Session 1: 8:00 AM U.S. PDT / 5:00 PM CEST (EMEA)
Session 2: 5:00 PM U.S. PDT / 8:00 AM China Standard Time (UTC+8) - Thursday, May 14
Reliable power integrity is essential in AI data centers, where massive current demands and fast transients push power delivery networks to their limits. Accurately measuring these systems, however, depends not only on the device under test but also on the performance of the probing system. In high-current, fast-switching environments, probe flatness, common-mode rejection, noise, and ground loop susceptibility can significantly affect measurement accuracy.
In this webinar, we explore common pitfalls that introduce hidden measurement errors and demonstrate best practices for improving measurement fidelity. Using real examples with Tektronix TICP, TDP and Picotest probes, we show practical techniques to reduce noise, avoid ground loops, and enable reliable power integrity measurements for AI data center applications.
Along the way, we’ll share a few measurement examples that may be unfamiliar even to experienced engineers.
What you'll learn:
- Common measurement errors that affect power integrity validation
- How probe flatness, CMRR, and noise influence waveform accuracy
- Techniques to reduce ground loops and measurement noise
- Best practices for reliable PDN measurements in AI data center systems
An audience Q&A session will follow the technical presentation
